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The use of correlation technique combined with sigma-delta-modulation for detection of defective sensor elements (2001)

Abstract
This paper presents a novel technique for detection of defective sensor elements. For this purpose the sensor elementis electrically stimulated using a pseudo random binary sequence (PRBS). The sensor element is read out and the analog output is digitized using a sigma-delta-modulator. In case of a defect-free sensor system the binary pulse density output of the sigma-delta-modulator contains the PRBS. A matched filter is used as a correlatorfor detection of the PRBS in the binary output and its sampled output is compared to a threshold. This comparison makes it possible to evaluate the functionality of the sensor system including the sensor element. Our solution for detection of detective sensor elements has been fully integrated using a 1.2µm CMOS process with only a moderate hardware overhead. Due to the small stimulation amplitudes using correlation technique no disturbance of the actual measurement happens.

Publication details
Repository Fraunhofer Publica (Germany)
Keywords fehlertolerantes System, Fehlererkennung, Korrelation
Type Conference Paper
Language english
Relation Porra, V.: Circuit paradigm in the 21st century. Proceedings of the 15th European Conference on Circuit Theory and Design. Vol.2: Helsinki University of Technology, Finland, 28th - 31st August 2001. Espoo, 2001, pp. 349-352 : Lit.