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In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe (2005)
Wark, A.
,
Berlouis, L. E. A.
,
Jackson, F.
,
Lochran, S.
,
Cruickshank, F. R.
,
Brevet, P. F.
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