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Thermally stable, oxidation resistant capping technology for Ti/Al ohmic contacts to n-GaN (2002)

Abstract
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Publication details
Download http://link.aip.org/link/?jap/92/4283
http://digital.library.wisc.edu/1793/8944
http://dx.doi.org/10.1063/1.1507809
Publisher AIP
Repository MINDS @ UW (United States)
Relation http://www.aip.org
http://jap.aip.org