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Technology-caused performance limitation of the common-gate LNA (2007)

Abstract
In this paper, the performance limitation of common-gate LNAs (CG-LNAs) caused by short channel effects is presented. The analysis is based on equations, which describes the behavior of the MOSFET including the noise sources in all possible regions of operation. From these equations, the input time constant tau in is defined as one characteristic performance figure of the used CMOS technology. The bias dependent limitation of the noise figure N F and minimum input reflection coefficient min (S 11, dB) is derived in dependence of tau in. The paper shows furthermore the advantage of biasing the CG-LNA in the moderate inversion region.

Publication details
Repository Fraunhofer Publica (Germany)
Keywords CG-LNA, Technologieeinfluss, Performance Grenze
Type Conference Paper
Language english
Relation Institute of Electrical and Electronics Engineers -IEEE-: ECCTD 2007,18th European Conference on Circuit Theory and Design: August 26-30, Sevilla, Spain. New York, NY: IEEE, 2007, pp. 60-63