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MOS-capacitor based CMOS time-compression photogate pixel for time-of-flight imaging (2007)

Abstract
In this investigation we study different readout possibilities if using a metal-oxide-semiconductor capacitor (MOS-C) as a photodetector in a standard 0.5µm twin-well CMOS process. The pixel readout principles are intended to be used in high-speed near-infra red (NIR) 3-D CMOS imaging, based on Time-of-Flight (TOF) measurements. We discuss various issues and present an extensive study of the MOS-C based photodetector structure. Also, we propose a novel CMOS imaging pixel: the time-compression charge-injection photogate (CMOS TC-PG), fabricated in the same process.

Publication details
Repository Fraunhofer Publica (Germany)
Keywords CMOS imaging, Charge injection, time-compression amplification, standard 0.5um CMOS
Type Conference Paper
Language english
Relation Schmitt-Landsiedel, D.: ESSCIRC 2007, 33rd European Solid-State Circuits Conference. Proceedings: September 10-14, 2007, München, Germany. New York, NY: IEEE, 2007, pp. 340-343