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Evidence for the existence of a metal-insulator-semiconductor junction at the electrode interfaces of CaCu3Ti4O12 thin film capacitors (2007)
Deng, G.
,
Yamada, T.
,
Muralt, P.
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http://infoscience.epfl.ch/record/118697
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Infoscience | Ecole Polytechnique Federale de Lausanne (Switzerland)
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