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Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy (2005)

Publication details

Download	http://hdl.handle.net/2433/39812 http://link.aip.org/link/?rsi/76/053704
Publisher	AMER INST PHYSICS
Repository	Kyoto University Research Information Repository (KURENAI) ()
Type	Journal Article
Language	English
Relation	10.1063/1.1896938