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The Effect of Incident Cluster Ion Size on Secondary Ion Yields Produced from Si (2007)
Ninomiya, S
,
Ichiki, K
,
Nakata, Y
,
Seki, T
,
Aoki, T
,
Matsuo J
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http://hdl.handle.net/2433/67604
Publisher
Materials Research Society of Japan
Repository
Kyoto University Research Information Repository (KURENAI) (Japan)
Type
Journal Article
Language
English