| A Note on the Complexity of Reliability in Neural Networks (2008) | |||||||||||||
Abstract | |||||||||||||
| It is shown that in a standard discrete neural network model with small fan-in, tolerance to random malicious faults can be achieved with a log-linear increase in the number of neurons and a constant factor increase in parallel time, provided fan-in can increase arbitrarily. A similar result is obtained for a nonstandard but closely related model with no restriction on fan-in. 1 | |||||||||||||
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