| A new laser test stand for simulating charged-particle tracks (2007) | |||||||||||||
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| We report on the construction of a new laser test stand equipped with a 1064nm pulsed infrared YAG laser for simulating the passage of a charged particle in a silicon detector. The standard semiconductor repairing tool, the socalled laser-cutter, has been modified to have a newly developed optics which has the ability to reduce the light by the order of 10 6 | |||||||||||||
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