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On-chip copper-based vs. optical interconnects: delay uncertainty, latency, power, and bandwidth density comparative predictions (2006)

Abstract
Abstract — As CMOS technology is scaled, it has become increasingly difficult for conventional copper interconnect to satisfy different design requirements. On-chip optical interconnect has been considered as a potential substitute for electrical interconnect. In this paper, predictions of the performance of CMOS compatible optical devices are made based on current state-ofart optical technologies. Based on these predictions, electrical and optical interconnects are compared for delay uncertainty, latency, power, and bandwidth density. I.

Publication details
Download http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.77.9038
Source http://www.ece.rochester.edu/users/friedman/papers/IIT_06.pdf
Contributors CiteSeerX
Repository CiteSeerX - Scientific Literature Digital Library and Search Engine (United States)
Type text
Language English
Relation 10.1.1.131.8101, 10.1.1.80.8850