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PARTICLE-INDUCED X-RAY EMISSION (PIXE): A TOOL FOR MULTIELEMENT ANALYSIS IN THE YEAST CELLS (2004)

Ileana Cornelia Farcasanu,
F. Nishiyama,
T. Miyakawa

Abstract

The analytical particle-induced X-ray emission (PIXE) procedure for the multielementanalysis offers great potential for trace element analysis in the biological and medical fields.Here we present the PIXE procedure as an accurate tool to detect both the major and the tracechemical elements within the Saccharomyces cerevisiae cells.

Publication details

Download	http://gw-chimie.math.unibuc.ro/anunivch/2004/AUBCh2004XIII123943.pdf http://www.doaj.org/doaj?func=openurl&genre=article&issn=1220871X&date=2004&volume=XIII&issue=I-II&spage=39
Publisher	Ars Docendi Publishing House
Repository	DOAJ-Articles (Sweden)