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Nanowire bonding with the scanning tunneling microscope (1997)

Abstract
We have developed a reliable lithographic method to pattern thin gold films by locally exposing a thin layer of an electron beam resist with the tip of a scanning tunneling microscope (STM). The exposure of the resist layer is induced by applying a voltage difference of ca. -10V between the STM tip and the gold film on top of which the resist layer has been deposited with the Langmuir-Blodgett technique. Our resist material is omega-tricosenoic acid which acts as a negative resist. After development, the unexposed areas of the gold film can be removed via argon ion milling. We have been able to obtain continuous gold lines having a width down to 15 nm, the linewidth being determined by the exposure dose. When reducing the tunneling voltage

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Publisher Elsevier science bv
Repository Lirias is a research document repository at KULeuven (Belgium)
Keywords atomic force microscopy, electrical transport (conductivity, resistivity, mobility, etc.), electrical transport measurements, fullerenes, metallic films, polycrystalline thin films, quantum effects, scanning tunneling microscopy, universal conductance fluctuations, thin gold-films, carbon nanotubes, electrical-conductivity, weak localization, 2 dimensions, tubules, systems, resistance, transport
Type DI, other
Language English
Relation Surface science vol:386 issue:1-3 pages:279-289