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Defect structure in micropillars using x-ray microdiffraction. (2006)
Maaß, R.
,
Grolimund, D.
,
Van Petegem, S.
,
Willimann, M.
,
Jensen, M.
,
Van Swygenhoven, H.
Abstract
Applied Physics Letters, 89(2006) S.151905/1-3. DOI:10.1063/1.2358204
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Keywords
430105
Type
ZSI, EM
Language
isi