A. A. Istratov

Publication List Details

Period

2002 - 2007

Number

20

Co-Authors

Structural and Electrical Properties of Metal Silicide Precipitates in Silicon (2007)

M. Seibt, H. Hedemann, A. A. Istratov, F. Riedel, A. Sattler, W. Schroèter

This paper summarizes current understanding of structural and electronic properties of metal silicide precipitates in silicon and their interrelation. Combined studies of high-resolution transmission...

Synchrotron-based investigations of the nature and impact of iron contamination in multicrystalline silicon solar cells (2005)

Buonassisi, T., Istratov, A.A., Heuer, M., Marcus, M.A., Jonczyk, R., Isenberg, J., ...

Synchrotron-based microprobe techniques were used to obtain systematic information about the size distribution, spatial distribution, shape, electrical activity, chemical states, and origins of...

Statistically meaningful data on the chemical state of iron precipitates in processed multicrystalline silicon using synchrotron-based X-ray absorption spectroscopy (2004)

Buonassisi, T., Heuer, M., Istratov, A.A., Weber, E.R., Cai, Z., Lai, B., ...

X-ray fluorescence microscopy (mu-XRF), x-ray beam induced current (XBIC), and x-ray absorption spectromicroscopy (mu-XAS) were performed on fully-processed BaySix cast multicrystalline silicon and...

Metal content of multicrystalline silicon for solar cells and its impact on minority carrier diffusion length (2004)

Istratov, A.A., Buonassisi, T., McDonald, R.J., Smith, A.R., Schindler, R., Rand, J., ...

The metal content of three types of silicon material for cost-efficient solar cells, Astropower silicon-film sheet material, Baysix cast material, and EFG ribbon-grown multicrystalline silicon was...

Metal content of multicrystalline silicon for solar cells and its impact on minority carrier diffusion length (2003)

Istratov, A.A., Buonassisi, T., McDonald, R.J., Smith, A.R., Schindler, R., Rand, J.A., ...

Instrumental neutron activation analysis was performed to determine the transition metal content in three types of silicon material for cost-efficient solar cells: Astropower silicon-film sheet...

Injection-dependent lifetime studies of copper precipitates in silicon (2002)

Macdonald, D., Brendle, W., Cuevas, A., Istratov, A.A.

Copper precipitates have been deliberately formed in single-crystal silicon wafers in order to study their impact on carrier lifetimes. The injection dependence of the measured lifetimes of samples...

Injection-dependent lifetime studies of copper precipitates in silicon (2002)

Macdonald, D., Brendle, W., Cuevas, A., Istratov, A.A.

Copper precipitates have been deliberately formed in single-crystal silicon wafers in order to study their impact on carrier lifetimes. The injection dependence of the measured lifetimes of samples...

X-ray beam induced current - a synchrotron radiation based technique for the in situ analysis of recombination properties and chemical nature of metal clusters in silicon (2002)

Vyvenko, O.F., Buonassisi, T., Istratov, A.A., Hieslmair, H., Thompson, A.C., Schindler, R., ...

A synchrotron radiation based x-ray microprobe analytical technique, x-ray beam induced current (XBIC), is suggested and demonstrated at the Advanced Light Source at the Lawrence Berkeley National...

Injection-dependent lifetime studies of copper precipitates in silicon (2002)

Macdonald, D., Brendle, W., Cuevas, A., Istratov, A.A.

Copper precipitates have been deliberately formed in single-crystal silicon wafers in order to study their impact on carrier lifetimes. The injection dependence of the measured lifetimes of samples...

Injection-dependent lifetime studies of copper precipitates in silicon (2002)

Macdonald, D., Brendle, W., Cuevas, A., Istratov, A.A.

Copper precipitates have been deliberately formed in single-crystal silicon wafers in order to study their impact on carrier lifetimes. The injection dependence of the measured lifetimes of samples...

Injection-dependent lifetime studies of copper precipitates in silicon (2002)

Macdonald, D., Brendle, W., Cuevas, A., Istratov, A.A.

Copper precipitates have been deliberately formed in single-crystal silicon wafers in order to study their impact on carrier lifetimes. The injection dependence of the measured lifetimes of samples...