Kopycinska-Müller, M., Caron, A., Hirsekorn, M., Rabe, U., Natter, H., Hempelmann, R., ...
Atomic force acoustic microscopy (AFAM) is a near-field technique, where the vibration behavior of a micro-fabricated elastic cantilever beam in contact with a sample surfaceis sensitive to its local...
Caron, A., Rabe, U., Rödel, J., Arnold, W.
Scanning probe microscopy techniques enable one to investigate surface properties such as contact stiffness and friction between the probe tip and a sample with nm resolution. So far the bending and...
Rabe, U., Arnold, W., Caron, A., Hirsekorn, S., Schwarz, K.
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe echniques to ultrasonics. Atomic force acoustic microscopy (AFAM) and lateral...
Atomic force microscopy at ultrasonic frequencies (2005)
Arnold, W., Caron, A., Hirsekorn, S., Kopycinska-Müller, M., Rabe, U., Reinstädtler, M.
The AFAM and ultrasonic piezo-mode techniques described here lend itself for studying materials properties in ceramics on a nanoscale. Whereas the various imaging modes become more and more routine,...
Imaging using lateral bending modes of atomic force microscope cantilevers (2004)
Caron, A., Rabe, U., Reinstadtler, M., Turner, Joseph A., Arnold, W.
Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force...
Caron, A., Rabe, U., Arnold, W.
Die genaue Kenntnis der mechanischen Eigenschaften von Werkstoffen ist für ihren Einsatz unentbehrlich. Mit der Entwicklung nanoskaliger Werkstoffe wächst das Bedürfnis nach Prüfverfahren, deren...
Ultrasonic modes in atomic force microscopy (2004)
Kopycinska-Müller, M., Reinstädtler, M., Rabe, U., Caron, A., Hirsekorn, S., Arnold, W.
Atomic Force Acoustic Microscopy (AFAM) and Lateral Atomic Force Acoustic Microscopy (LAFAM) are dynamic enhancements of the Atomic Force Microscope (AFM). They combine the high lateral resolution of...
Imaging using lateral bending modes of atomic force microscope cantilevers (2004)
Caron, A., Rabe, U., Reinstädtler, M., Turner, J., Arnold, W.
Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force...
Zinin, P.V., Fei, D., Rebinsky, D.A., Berezina, S., Manghnani, M., Lemor, R.M., ...
DLC films are beginning to find their way into industrial applications to prolong the life of machine components. Preliminary wear tests on nano-structured DLC coated samples demonstrated an...
Die Entwicklung neuer keramischer Werkstoffe während der letzten Dekaden hat einen raschen Anstieg erfahren. Dank der Vielfältigkeit ihrer mechanischen und physikalischen Eigenschaften haben sich...
Hirsekorn, S., Kopycinska-Müller, M., Rabe, U., Reinstädtler, M., Caron, A., Arnold, W.
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a sensor tip are used to generate high-resolution images of sample surfaces. In dynamic modes, the...
Anti-P30 IgA antibodies as prenatal markers of congenital toxoplasma infection
Decoster, A., Darcy, F., Caron, A., Vinatier, D., De L'Aulnoit, D. Houze, Vittu, G., ...
This study extends a previous study and confirms that the detection of anti-P30 IgA antibodies is very helpful in the diagnosis of acute acquired or congenital toxoplasmosis. Moreover, we demonstrate...