Period
1989 - 1995
Number
3
Co-Authors
Structural and optical properties of nitrited silicon oxide layers rapid thermally grown in pure N20 ambient (1995)
Hartmannsgruber, E., Rossow, U., Hoyer, A., Lange, P.
Spatial resolution tests of scanning auger microscopy under different topographical conditions (1989)
Umbach, A., Hoyer, A., Brünger, W.H.
Highly focused electron beams have been scanned across chemical edges of different surface structures in a scanning Auger microscope with a field emission gun. For the case of a fracture plane across...
Neuroleptic malignant syndrome in Kufs' disease
Reif, A, Schneider, M, Hoyer, A, Schneider-Gold, C, Fallgatter, A, Roggendorf, W, ...