A. Rudra

Publication List Details

Period

1989 - 2008

Number

136

Co-Authors

Characterization of Ingaas and Inalas Layers on Inp by 4-Crystal High-Resolution X-Ray-Diffraction and Wedge Transmission Electron-Microscopy (2007)

Houdre, R., Gueissaz, F., Gailhanou, M., Ganiere, J. D., Rudra, A., Ilegems, M.

The indium desorption rates from InGaAs and InAlAs grown on InP substrates have been measured by wedge transmission electron microscopy as a function of the growth temperature. Desorption becomes...