RADIATION STUDY ON MOS STRUCTURES. (2005)
Ionizing radiation causes the build-up of a positive space-charge within the oxide on an MOS structure. The location of this space-charge and the kinetics of its formation and annealing have been...
RADIATION STUDY ON MOS STRUCTURES, (2005)
Snow,E. H., Grove,A. S., Fitzgerald,D. J.
The report examines in detail the effects of electron, X-ray, and ultraviolet radiation on oxidized silicon surfaces and Planar devices. Two permanent surface effects of ionizing radiation are...
RADIATION STUDY ON MOS STRUCTURES, (2005)
Snow,E. H., Grove,A. S., Fitzgerald,D. J.
Two effects of ionizing radiation on oxidized silicon surfaces have been reported: the formation of a space charge in the oxide and the creation of surface states at the oxide-silicon interface. In...
A STUDY OF FAILURE MECHANISMS IN SILICON PLANAR EPITAXIAL TRANSISTORS. (1998)
Sello, H., Blech, I. A., Grove, A. S., Snow, E. H., Fitzgerald, J. D.
A gated planar diode was used on a test structure to study the effect of charges on the oxide and to determine oxide sheet resistivities. Important factors found to affect sheet resistivity were...
A STUDY OF FAILURE MECHANISMS IN SILICON PLANAR EPITAXIAL TRANSISTORS. (1998)
Sello, H., Blech, I. A., Grove, A. S., Fitzgerald, D. J., Lawrence, J. E.
This report covers the entire 18-month period in this study of the mechanisms that lead to failure in silicon n-p-n planar epitaxial transistors. The approach taken was the division of the...
Rhinoscleroma with exophthalmos: a case report.
Lubin, J. R., Jallow, S. E., Wilson, W. R., Grove, A. S., Albert, D. M.
This is a report of a 20-year-old Nigerian man with a 15-year history of exophthalmos and nasal blockage caused by rhinoscleromatous. The diagnosis was made by histopathological examination of a...