Rakotoniaina, J.P., Breitenstein, O., Werner, M., Hejjo, Al Rifai, Buonassisi, T., Pickett, M.D., ...
Detection of cracks in silicon wafers and solar cells by ultrasonic lock-in thermography (2004)
Rakotoniaina, J.P., Breitenstein, O., Hejjo, Al Rifai, Franke, D., Schneider, A.