FULLSPECTRUM: a new PV wave making more efficient use of the solar spectrum (2005)
Luque, A., Marti, A., Bett, A., Andreev, V.M., Jaussaud, C., Roosmalen, J.A.M., ...
FULLSPECTRUM: A new PV wave making more efficient use of the solar spectrum (2005)
Marti, A., Bett, A., Andreev, V.M., Jaussaud, C., Alonso, J., ...
Hydrolysis of protactinium(V). III. Determination of standard thermodynamic data (2003)
Trubert, D., Le Naour, C., Jaussaud, C., Mrad, O.
Hydrolysis constants of protactinium(V) at tracer scale were deduced from the variations of partition coefficient of Pa(V) in the system: TTA/toluene/Pa(V)/H2O/H+/Na+/ClO4-, as a function of TTA and...
Le Naour, C., Trubert, D., Jaussaud, C.
The hydrolysis of protactinium (V) was studied at tracer scale (ca. 10(-12) M) with the solvent extraction method involving the aqueous system: Pa(V)/H2O/H+/Na+/ClO4- at 40 and 60degreesC for three...
Hydrolysis of protactinium(V). III. Determination of standard thermodynamic data (2003)
Trubert, D., Le Naour, C., Jaussaud, C., Mrad, O.
Hydrolysis constants of protactinium(V) at tracer scale were deduced from the variations of partition coefficient of Pa(V) in the system: TTA/toluene/Pa(V)/H2O/H+/Na+/ClO4-, as a function of TTA and...
Le Naour, C., Trubert, D., Jaussaud, C.
The hydrolysis of protactinium (V) was studied at tracer scale (ca. 10(-12) M) with the solvent extraction method involving the aqueous system: Pa(V)/H2O/H+/Na+/ClO4- at 40 and 60degreesC for three...
Trubert, D., Le Naour, C., Jaussaud, C.
The hydrolysis of protactinium(V) was studied at tracer scale (ca. 10(-12) M) with the solvent extraction method involving the aqueous system: Pa(V)/H2O/H+/Na+/ClO4- at 25.0degreesC for three values...
Trubert, D., Le Naour, C., Jaussaud, C.
The hydrolysis of protactinium(V) was studied at tracer scale (ca. 10(-12) M) with the solvent extraction method involving the aqueous system: Pa(V)/H2O/H+/Na+/ClO4- at 25.0degreesC for three values...
Low frequency noise in silicon carbide Schottky diodes (1997)
Anghel, L., Ouisse, T., Billon, T., Lassagne, P., Jaussaud, C.
The excess low frequency noise of silicon carbide Schottky diodes has been systematically measured on n-type SiC devices with Ti gates. The noise results have been related to general properties such...
Experimental investigation of noise sources in silicon carbide Schottky barriers (1996)
Anghel, L., Ouisse, T., Billon, T., Lassagne, P., Jaussaud, C.
The excess low frequency noise of silicon carbide Schottky diodes has been systematically measured on n-type silicon carbide devices with Ti gate. The noise results have been related to general...
RECUIT D'IMPLATATION PAR FAISCEAU D'ÉLECTRONS BALAYÉS (1983)
Jaussaud, C., Biasse, B., Cartier, A., Bontemps, A.
Des échantillons de silicium dopés au Bore par implantation (BF2 30 Kev, 1015 ions x cm-2) ont été recuits à l'aide d'un faisceau d'électrons balayés, à des températures allant de 1000 à...
RECUIT D'IMPLATATION PAR FAISCEAU D'ÉLECTRONS BALAYÉS (1983)
Jaussaud, C., Biasse, B., Cartier, A., Bontemps, A.
Des échantillons de silicium dopés au Bore par implantation (BF2 30 Kev, 1015 ions x cm-2) ont été recuits à l'aide d'un faisceau d'électrons balayés, à des températures allant de 1000 à...
RECUIT D'IMPLATATION PAR FAISCEAU D'ÉLECTRONS BALAYÉS (1983)
Jaussaud, C., Biasse, B., Cartier, A., Bontemps, A.
Des échantillons de silicium dopés au Bore par implantation (BF2 30 Kev, 1015 ions x cm-2) ont été recuits à l'aide d'un faisceau d'électrons balayés, à des températures allant de 1000 à...