Capacitance-Voltage Characterization of GaAs-Oxide Interfaces (2008)
Brammertz, G, Lin, H C, Martens, K, Mercier, D, Merckling, C, Penaud, J, ...
We will shortly review the basic physics of charge-carrier trapping and emission from trapping states within the bandgap of a semiconductor in order to show that high-temperature capacitance-voltage...