Berto, V.Z., Matias, L.F., Nascimento, E. Do
Os Sistemas de Informações Geográficas (SIG) consistem num instrumental tecnológico que permite o processamento e a análise de dados georreferenciados, otimizando a produção de informações...
Study of the Electron-Positron Annihilation Coincidence Peak Two-Dimensional Profile (2006)
O. Helene, V. R. Vanin, E. Do Nascimento, C. Takiya
Study of the Electron-Positron Annihilation Coincidence Peak Two-Dimensional Profile
Study of the Doppler Broadening of Positron Annihilation Radiation in Silicon (2006)
O. Helene, V. R. Vanin, M. Moralles, E. Do Nascimento
Study of the Doppler Broadening of Positron Annihilation Radiation in Silicon
Study of the Doppler broadening of positron annihilation radiation in silicon (2005)
Nascimento,E. Do, Helene,O., Vanin,V. R., Moralles,M.
We report the measurement of Doppler broadening annihilation radiation in silicon, using 22Na as a positron source, and two Ge detectors arrangement. The two-dimensional coincidence energy spectrum...
Study of the electron-positron annihilation coincidence peak two-dimensional pofile (2004)
Nascimento,E. Do, Helene,O., Vanin,V. R., Takiya,C.
Positron annihilation radiation profi le in aluminum was observed with a pair of Ge detectors in coincidence. 22Na was used as a source of positron and the two-dimensional gamma energy spectrum wasfi...