E. Dooryhee

Re-entrant magneto-elastic transition in HoFe4Ge2: an XRPD study (2002)

Schobinger-Papamantellos, P., Rodriguez-Carvajal, J., Buschow, K.H.J., Dooryhee, E., Fitch, A.N.

Etude Par Resonnance Paramagnetique Electronique Des Defauts Formes Dans Sio$_2$ Par Les Ions De Grande Energie (2000)

Dooryhee, E

The double-phase transition of ErFe4Ge2. An XRPD study (2000)

Schobinger-Papamantellos, P., Rodriguez-Carvajal, J., Buschow, K.H.J., Dooryhee, E., Fitch, A.N.

Formation of Si nanocrystals by heavy ion irradiation of amorphous SiO films (1996)

Roditchev, Dimitri, Lavallard, Philippe, Dooryhee, E., Slaoui, A., Perrière, Jacques, Gandais, M., ...

We studied the structural transformations of a-SiO thin films caused by swift heavy ion irradiation at room temperature. Rutherford backscattering spectroscopy, nuclear reaction analysis,...

Track formation in SiO$_2$ quartz and the thermal spike mechanism (1994)

Meftah, A., Brisard, F., Costantini, J.M., Dooryhee, E., Hage-Ali, M., Hervieu, M., ...

Track formation in SiO$_2$ quartz and the thermal spike mechanism (1994)

Meftah, A., Brisard, F., Costantini, J.M., Dooryhee, E., Hage-Ali, M., Hervieu, M., ...

Infrared spectrometry observations of SiO$_2$ films irradiated by high energy heavy ions (1993)

Busch, M.C., Slaoui, A., Dooryhee, E., Toulemonde, M.

Infrared spectrometry observations of SiO$_2$ films irradiated by high energy heavy ions (1993)

Busch, M.C., Slaoui, A., Dooryhee, E., Toulemonde, M.

Structural and electrical damage induced by high-energy heavy ions in SiO$_2$/Si structures (1992)

Busch, M.C., Slaoui, A., Siffert, P., Dooryhee, E., Toulemonde, M.

Structural and electrical damage induced by high-energy heavy ions in SiO$_2$/Si structures (1992)

Busch, M.C., Slaoui, A., Siffert, P., Dooryhee, E., Toulemonde, M.

Structural and electrical damage induced by high-energy heavy ions in SiO$_{2}$/Si structures (1991)

Busch, M.C., Slaoui, A., Siffert, P., Dooryhee, E., Toulemonde, M.

Structural and electrical damage induced by high-energy heavy ions in SiO$_{2}$/Si structures (1991)

Busch, M.C., Slaoui, A., Siffert, P., Dooryhee, E., Toulemonde, M.

Surface modifications of crystalline SiO$_2$ and Al$_2$O$_3$ induced by energetic heavy ions (1990)

Jollet, F., Duraud, J.P., Noguera, C., Dooryhee, E., Langevin, Y.

Surface modifications of crystalline SiO$_2$ and Al$_2$O$_3$ induced by energetic heavy ions (1990)

Jollet, F., Duraud, J.P., Noguera, C., Dooryhee, E., Langevin, Y.

Formation of paramagnetic defects in high-purity silica by high-energy ions (1988)

Dooryhee, E., Langevin, Y., Borg, J., Duraud, J.P., Balanzat, E.

Radiation effects in SiO$_2$ under electronic excitation (1988)

Duraud, J.P., Jollet, F., Langevin, Y., Dooryhee, E.

Characterization of defects formed in amorphous SiO$_2$ by high energy ions using electron spin resonance and optical spectroscopy (1988)

Dooryhee, E., Langevin, Y., Borg, J., Duraud, J.P., Balanzat, E.

Formation of paramagnetic defects in high-purity silica by high-energy ions (1988)

Dooryhee, E., Langevin, Y., Borg, J., Duraud, J.P., Balanzat, E.

Radiation effects in SiO$_2$ under electronic excitation (1988)

Duraud, J.P., Jollet, F., Langevin, Y., Dooryhee, E.

Characterization of defects formed in amorphous SiO$_2$ by high energy ions using electron spin resonance and optical spectroscopy (1988)

Dooryhee, E., Langevin, Y., Borg, J., Duraud, J.P., Balanzat, E.

Etude par resonnance paramagnetique electronique des defauts formes dans SiO$_2$ par les ions de grande energie (1987)

Dooryhee, E.

Etude par resonnance paramagnetique electronique des defauts formes dans SiO$_2$ par les ions de grande energie (1987)

Dooryhee, E.

Electron spin resonance observations of paramagnetic defects produced in fused silica by high-energy oxygen and krypton ions (1986)

Langevin, Y., Dooryhee, E., Borg, J., Duraud, J., Lecomte, C., Balanzat, E.

Electron spin resonance observations of paramagnetic defects produced in fused silica by high-energy oxygen and krypton ions (1986)

Langevin, Y., Dooryhee, E., Borg, J., Duraud, J., Lecomte, C., Balanzat, E.