The Superconducting Transition in Boron Doped Silicon Epilayers (2009)
Marcenat, C., Kacmarcik, J., Piquerel, R., Achatz, P., Prudon, G., Dubois, C., ...
We report on a detailed analysis of the superconducting properties of boron-doped silicon films grown along the 001 direction by Gas Immersion Laser Doping. The doping concentration cB has been...
Chemical effects in ion beam mixing of Fe-Al multilayers (1994)
Brenier, R., Canut, B., Gea, L., Ramos, S., Thevenard, P., Dubois, C., ...
Fe-Al multilayers have been mixed with Xe+ ions at high temperatures. The composition depth profiles have been analyzed by secondary ion mass spectroscopy (SIMS). It is shown that SIMS reveals the...
Chemical effects in ion beam mixing of Fe-Al multilayers (1994)
Brenier, R., Canut, B., Gea, L., Ramos, S., Thevenard, P., Dubois, C., ...
Fe-Al multilayers have been mixed with Xe+ ions at high temperatures. The composition depth profiles have been analyzed by secondary ion mass spectroscopy (SIMS). It is shown that SIMS reveals the...
Chemical effects in ion beam mixing of Fe-Al multilayers (1994)
Brenier, R., Canut, B., Gea, L., Ramos, S., Thevenard, P., Dubois, C., ...
Fe-Al multilayers have been mixed with Xe+ ions at high temperatures. The composition depth profiles have been analyzed by secondary ion mass spectroscopy (SIMS). It is shown that SIMS reveals the...