Area Fill Generation With Inherent Data Volume Reduction \Lambda (2008)
Yu Chen, Andrew B. Kahng, Gabriel Robins Alex, Er Zelikovsky, Yuhong Zheng
Abstract Area Fill Generation With Inherent Data Volume Reduction (2008)
Yu Chen, Andrew B. Kahng, Gabriel Robins Alex, Er Zelikovsky, Yuhong Zheng
Control of variability and performance in the back end of the VLSI manufacturing line has become extremely difficult with the introduction of new materials such as copper and low-k dielectrics....
Abstract Area Fill Generation With Inherent Data Volume Reduction (2007)
Yu Chen, Andrew B. Kahng, Gabriel Robins Alex, Er Zelikovsky, Yuhong Zheng
Control of variability and performance in the back end of the VLSI manufacturing line has become extremely difficult with the introduction of new materials such as copper and low-k dielectrics....