Capacitance-Voltage Characterization of GaAs-Oxide Interfaces (2008)
Brammertz, G, Lin, H C, Martens, K, Mercier, D, Merckling, C, Penaud, J, ...
We will shortly review the basic physics of charge-carrier trapping and emission from trapping states within the bandgap of a semiconductor in order to show that high-temperature capacitance-voltage...
Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures (2003)
Katcki,J., Ratajczak,J., Laszcz,A., Phillipp,F., Dubois,E., Larrieu,G., ...
Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures (2003)
Katcki, J., Ratajczak, J., Laszcz, A., Phillipp, F., Dubois, E., Larrieu, G., ...
Comparison of gingival index and sulcus bleeding index as indicators of periodontal status
Benamghar, L., Penaud, J., Kaminsky, P., Abt, F., Martin, J.
Although the gingival index and sulcus bleeding index have been widely used as indicators of periodontal status, there is some disagreement among investigators as to their meaning and significance. A...