RADIATION EFFECTS IN SILICON AND GERMANIUM. (2005)
Srour,J. R., Bass,R. F., Wikner,E. G.
The results of several related studies of radiation effects in silicon and germanium are described. Studies of short-term annealing phenomena in silicon include a comparison of the effects of fusion...
Radiation Effects on MSI/LSI Electronic Devices and Circuits. (2005)
Raymond, J. P., Pocock, D. N., Srour, J. R., Johnson, R. E., Fujii, G. T.
Transient radiation effects was investigated on bipolar and MOS MSI/LSI devices as well as basic thin-film devices. The transient susceptibility of the junction-isolated bipolar and MOS devices was...
Radiation Effects in Silicon and Germanium. (2005)
Srour,J. R., Othmer,S., Rauch,R. B.
The report describes the results of several related studies of radiation effects in silicon and germanium. Recombination parameters are determined for Co60 gamma-irradiated n-type germanium (low...
Radiation Effects on Semiconductor Materials and Devices. (1998)
Srour,J. R., Othmer,S., Chiu,K. Y., Deokar,V. D.
;Contents: Analytical studies; Recombination in irradiated silicon; Charge transport in silicon dioxide; Ionizing radiation effects on MOS devices; Measurement of drift mobility in low-lifetime...
Othmer,S., Srour,J. R., Shanfield,Z., Hartmann,R. A., Hopkins,M. A.
This report describes results of a study of radiation effects on electronic materials, devices, and integrated circuits. Emphasis is placed on determining the basic mechanisms of the interaction of...
On the formation of ohmic contacts between metals and insulators / (1969)
Diss. Catholic University of America. 1968.