IRAS Minor Planet Survey. (9999)
Tedesco, Edward F., Veeder, Glenn J., Fowler, John W., Chillemi, Joseph R.
This report documents the program and data used to identify known asteroids observed by the Infrared Astronomical Satellite (IRAS) and to compute albedos and diameters from their IRAS fluxes. It also...
Rachel T. Johnson, Sonia E. Leach, John W. Fowler, Gerald T. Mackulak
In the analysis of a manufacturing system, the analyst is often interested in the change in mean cycle time as a function of different throughput (start rate) levels. Since the variance of the mean...
AWAIC: A WISE Astronomical Image Co-adder (2008)
Masci, Frank J., Fowler, John W.
We describe a new image co-addition tool, AWAIC, to support the creation of a digital Image Atlas from the multiple frame exposures acquired with the Wide-field Infrared Survey Explorer (WISE). AWAIC...
This paper surveys the literature related to solving traditional unrelated parallel-machine scheduling problems. It compiles algorithms for the makespan, total weighted sum of completion times,...
CYCLE-TIME QUANTILE ESTIMATION IN MANUFACTURING SYSTEMS EMPLOYING DISPATCHING RULES (2008)
M. E. Kuhl, N. M. Steiger, F. B. Armstrong, J. A. Joines, Jennifer E. Mcneill, John W. Fowler, ...
The cycle-time distribution of manufacturing systems employing dispatching rules other than FIFO can be both highly skewed and have heavy tails. Previous cycle-time quantile estimation work has...
Jeffrey D. Laub, John W. Fowler, Ahmet Keha
Abstract: New semiconductor wafer fabrication facilities use Front Opening Unified Pods (FOUPs) as a common unit of wafer transfer. Since the number of pods is limited due to high costs, and the...
Abstract The single machine multiple orders per job scheduling problem (2008)
Scott J. Mason, Peng Qu, Erhan Kutanoglu, John W. Fowler
The standard unit of transfer in new semiconductor wafer fabrication facilities is the front opening unified pod (FOUP). Due to automated material handling system and cost concerns, the number of...
E. Yücesan, J. L. Snowdon, J. M. Charnes, Juergen Potoradi, Ong Siong Boon, ...
This paper describes how a large number of products are scheduled to run in parallel on a pool of wire-bond machines to meet weekly demand. We seek to maximize demand fulfillment subject to system...
Lauren Fowler, Michele Pfund, Lian Yu, John W. Fowler, W. Matthew Carlyle
We investigate the performance of five approaches to scheduling a Japanese printed wiring board manufacturer’s drilling operation subject to uncertainty. We present and evaluate two optimization...
The IRAS Minor Planet Survey (2006)
Tedesco, Edward F., Veeder, Glenn J., Fowler, John W., Chillemi, Joseph R.
This report documents the program and data used to identify known asteroids observed by the Infrared Astronomical Satellite (IRAS) and to compute albedos and diameters from their IRAS fluxes. It also...
Grand challenges in modeling and simulation of complex manufacturing systems (2004)
John W. Fowler, Oliver Rose, John W. Fowler, Oliver Rose
On behalf of:
Grand challenges in modeling and simulation of complex manufacturing systems (2004)
Even though we have moved beyond the Industrial Age and into the Information Age, manufacturing remains an important part of the global economy. There have been numerous efforts to use modeling and...
Jeffery K. Cochran, Shwu-min Horng, John W. Fowler
In this paper we propose a two-stage Multi-Population Genetic Algorithm (MPGA) to solve parallel machine scheduling problems with multiple objectives. In the first stage, multiple objectives are...
Pointing Refinement of SIRTF Images (2002)
Masci, F., Makovoz, D., Moshir, M., Shupe, D., Fowler, John W.
The soon-to-be-launched Space Infrared Telescope Facility (SIRTF) shall produce image data with an a-posteriori pointing knowledge of 1.4 arcsec (1 sigma radial) with a goal of 1.2 arcsec in the...
Multivariate Statistical Methods for Modeling and Analysis of Wafer Probe Test Data (2002)
Katina R. Skinner, Douglas C. Montgomery, George C. Runger, John W. Fowler, Daniel R. Mccarville, Teri Reed Rhoads, ...
Abstract—Probe testing following wafer fabrication can produce extremely large amounts of data, which is often used to inspect a final product to determine if the product meets specifications. This...
http://deepblue.lib.umich.edu/bitstream/2027.42/4945/5/bbm0209.0001.001.pdf
An historical sketch and genealogical record of the Fowlers of Milford, Ct. (1887)
Descendants of William Fowler who emigrated from England in 1637.
Heuristics for workforce planning with worker differences
Fowler, John W., Wirojanagud, Pornsarun, Gel, Esma S.
This study considers decisions in workforce management assuming individual workers are inherently different as measured by general cognitive ability (GCA). A mixed integer programming (MIP) model...