Nanowire bonding with the scanning tunneling microscope (1997)
Van Haesendonck, Christian; U0011549, Stockman, L, Vullers, RJM, Bruynseraede, Yvan; U0011882, Langer, L, Bayot, V, ...
We have developed a reliable lithographic method to pattern thin gold films by locally exposing a thin layer of an electron beam resist with the tip of a scanning tunneling microscope (STM). The...
Quantum transport in a multiwalled carbon nanotube (1996)
Langer, L, Bayot, V, Grivei, E, Issi, JP, Heremans, JP, Olk, CH, ...
We report on electrical resistance measurements of an individual carbon nanotube down to a temperature T = 20 mK. The conductance exhibits a lnT dependence and saturates at low temperature. A...
Electrical measurements on submicronic synthetic conductors - carbon nanotubes (1995)
Langer, L, Stockman, L, Heremans, Jp, Bayot, V, Olk, Ch, Van Haesendonck, Christian; U0011549, ...
The synthesis of very small samples has raised the need for a drastic miniaturization of the classical four-probe technique in order to realize electrical resistance measurements. Two methods to...
Electrical-resistance of a carbon nanotube bundle (1994)
Langer, L, Stockman, L, Heremans, Jp, Bayot, V, Olk, Ch, Van Haesendonck, Christian; U0011549, ...
The first direct electrical resistance measurements performed on a single carbon nanotube bundle from room temperature down to 0.3 K and in magnetic fields up to 14 T are reported. From the...
Nanolithographic patterning of metal-films with a scanning tunneling microscope (1994)
Van Haesendonck, Christian; U0011549, Stockman, L, Bruynseraede, Yvan; U0011882, Langer, L, Bayot, V, Issi, Jp, ...
We have developed a new technique, which allows to pattern thin evaporated Au films at the nanometer scale with a scanning tunnelling microscope (STM). The STM tip is used to expose a very thin layer...