K. Nakajima

Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical states. Surface and Interface Analysis (2008)

Nakajima, K., Zhao, M., Nohira, H., Hattori, T., Kobata, M., ...

The analysis of a thin SiO2/Si3N4/SiO2 stack: A comparative study of low-energy heavy ion elastic recoil detection, high-resolution Rutherford backscattering, and secondary ion mass spectrometry (2006)

Sajavaara, T, Janssens, T, Conard, T, ...

The analysis of thin films in the range of 10 nm and less has become very important in microelectronics. The goal of this article is an evaluation of low-energy TOF-ERDA (time-of-flight elastic...

High-energy spin dynamics in La§1§.§6§9Sr§0§.§3§1NiO§4. (2003)

Bourges, P., Sidis, Y., Braden, M., Nakajima, K., Transquada, J.M.

Physical Review Letters, 90(2003) S.147202/1-4

Bond-stretching-phonon anomalies in stripe-ordered La§1§.§6§9Sr§0§.§3§1NiO§4. (2002)

Tranquada, J.M., Nakajima, K., Braden, M., Pintschovius, L., Mc Queeney, R.J.

Physical Review Letters, 88(2002) S.075505/1-4

Mortality in relation to urinary and faecal incontinence in elderly people living at home (1999)

Nakanishi, N, Tatara, K, Shinsho, F, Murakami, S, Takatorige, T, Fukuda, H, ...