L. Adoui

Publication List Details

Period

1995 - 2006

Number

32

Co-Authors

Low intensity threshold values for keV X-ray production in laser-cluster interaction (2005)

Prigent, C., Adoui, L., Lamour, E., Vernhet, D., Gobert, O., ...

Absolute Ar XK (3 keV) and Xe XL (4 keV) photon yields are measured as a function of laser peak intensity, for large (104 - 105 atoms) argon and xenon clusters submitted to intense laser pulses. A...

Low intensity threshold values for keV X-ray production in laser-cluster interaction (2005)

Prigent, C., Adoui, L., Lamour, E., Vernhet, D., Gobert, O., ...

Absolute Ar XK (3 keV) and Xe XL (4 keV) photon yields are measured as a function of laser peak intensity, for large (104 - 105 atoms) argon and xenon clusters submitted to intense laser pulses. A...

Low intensity threshold values for keV X-ray production in laser-cluster interaction (2005)

Prigent, C., Adoui, L., Lamour, E., Vernhet, D., Gobert, O., ...

Absolute Ar XK (3 keV) and Xe XL (4 keV) photon yields are measured as a function of laser peak intensity, for large (104 - 105 atoms) argon and xenon clusters submitted to intense laser pulses. A...

Low intensity threshold values for keV X-ray production in laser-cluster interaction (2005)

Prigent, C., Adoui, L., Lamour, E., Vernhet, D., Gobert, O., ...

Absolute Ar XK (3 keV) and Xe XL (4 keV) photon yields are measured as a function of laser peak intensity, for large (104 - 105 atoms) argon and xenon clusters submitted to intense laser pulses. A...

Electron emission induced by fast heavy ions in a thin silicon crystal (2004)

Barrué, F., Chevallier, M., Dauvergne, D., Kirsch, R., Ray, C., ...

We report observations of backward and forward electron emission by a thin silicon crystal target traversed by 29 MeV/u Pb56+ incident ions. For each incident ion we have performed measurements of...