Assessing Stacking Faults in Bi-Sr-Ca-Cu-O Phases by X-Ray Diffraction. (1998)
Manaila, R., Miu, L., Zaharescu, M.
A Hendricks-Teller analysis of the X-ray diffraction line shifts in Bi-Sr-Ca-Cu-O phases allows an estimate of the stacking fault probabilities (missing or extra Cu-O layers). The probability values...
Crisan, A., Miu, L., Popa, S., Yang, Y., Beduz, C.
Current - voltage characteristics of multifilamentary Bi2Sr2Ca2Cu3O10/Ag tapes (short samples) produced by the `powder in tube' technique were measured at different temperatures close to the...
Crisan, A., Miu, L., Popa, S., Beduz, C.
The current-voltage characteristics of Bi[2]Sr[2]Ca[2]Cu[3]O[10]/Ag multifilamentary tapes were measured at different temperatures close to the critical temperature and in different applied magnetic...