Electrical Characterisation of Ultra-thin SAM Structures (2007)
Trapes, C., Rouai, L., Patrone, L.
The way of reduction of metal oxyde semiconductor (MOS) structures is going to reach limitations and new devices have to be explored as an alternative to MOS technology. Molecular electronic and more...
Electrical Characterisation of Ultra-thin SAM Structures (2006)
Trapes, C., Patrone, L., Rouai, L.
55-57
Electrical Characterisation of Ultra-thin SAM Structures (2006)
Trapes, C., Patrone, L., Rouai, L.
55-57
Electrical Characterisation of Ultra-thin SAM Structures (2005)
Trapes, C., Rouai, L., Patrone, L.
The way of reduction of metal oxyde semiconductor (MOS) structures is going to reach limitations and new devices have to be explored as an alternative to MOS technology. Molecular electronic and more...
Electrical Characterisation of Ultra-thin SAM Structures (2005)
Trapes, C., Rouai, L., Patrone, L.
The way of reduction of metal oxyde semiconductor (MOS) structures is going to reach limitations and new devices have to be explored as an alternative to MOS technology. Molecular electronic and more...
Su,T. T., Guo,B., Kawakami,Y., Sommer,K., Chae,K., Humphries,L. A., ...
Mechanics of Multi Walled Carbon Nanotubes Probed by AFM (2002)
Decossas, S., Patrone, L., Comin, F., Chevrier, J.
Using the AFM tip, nanotubes are caught on a raw sample then deposited on a clean surface with an absolute precision better than 500nm. A nanostructured surface made of smooth Germanium dots on flat...