M. Enachescu

AMS - Sensitive tool used as nuclear safeguard and to diagnose fusion experiments (2007)

Stan-Sion, C., Roth, J., Krieger, K., Enachescu, M., Ertl, K., Lazarev, V., ...

The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum (2004)

Enachescu, M., Carpick, Robert W, Ogletree, D. F, Salmeron, Miguel

Scanning probe microscopy was used to investigate the tribological properties of nanoscale tips in contact with a Pt(111) single-crystal surface under ultrahigh vacuum conditions. The tips were...

Scale-Free Aggregation in Sensor Networks (2004)

M. Enachescu, A. Goel, R. Govindan, R. Motwani

The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum (2004)

Enachescu, M., Carpick, R.W., Ogletree, D.F., Salmeron, M.

This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying...

Atomic Force Microscopy Study of an Ideally Hard Contact: The Diamond(111)/Tungsten Carbide Interface (1998)

Enachescu, M., Carpick, Robert W, Ogletree, D. F, Flipse, C. F. J, Salmeron, Miguel

A comprehensive nanotribological study of a hydrogen-terminated diamond(111)/tungsten carbide interface has been performed using ultrahigh vacuum atomic force microscopy. Both contact conductance,...