Beamson, G., Mokarian-Tabari, P., Geoghegan, M.
Angle resolved XPS (ARXPS) and scanning force microscopy (SFM) are used to study polystyrene/poly(vinyl ethyl ether) 50/50 wt% blend thin films spin cast from toluene solution, as a function of...
J.C. Pinto, G.L. Whiting, S. Khodabakhsh, L. Torre, A. Rodriguez, ...
Journal article
The pH-induced swelling and collapse atom transfer radical polymerization (2006)
Geoghegan, M, Ruiz-Perez, L, Dang, CC, Parnell, AJ, Martin, SJ, Howse, JR, ...
We have used neutron reflectometry to characterize the swelling behaviour of brushes of poly[2-(diethyl amino)ethyl metbacrylate], a polybase, as a function of pH. The brushes, synthesized by the...
Current-induced chain migration in semiconductor polymer blends (2005)
Martin, SJ, Jones, RAL, Geoghegan, M, Higgins, AM, Grizzi, I, Halls, JJM, ...
We have used the technique of neutron reflectometry in order to evaluate the changes that occur within polymer light-emitting devices as they are operated. The devices examined consisted of an...
Responsive brushes and gels as components of soft nanotechnology (2005)
Ryan, A J, Crook, C J, Howse, J R, Topham, P, Jones, R A L, Geoghegan, M, ...
Interfacial structure in semiconducting polymer devices (2003)
Higgins, A M, Martin, SJ, Jukes, PC, Geoghegan, M, Jones, R A L, Langridge, S, ...
Surface segregation from polystyrene networks (2000)
Geoghegan, M, Boue, F, Menelle, A, Abel, F, Russ, T, Ermer, H, ...
The kinetics of penetration of grafted polymers into a network (1999)
Geoghegan, M, Clarke, C J, Boue, F, Menelle, A, Russ, T, Bucknall, D G