M. Kopycinska

Nanoscale imaging of elastic and piezoelectric properties of nanocrystalline lead calcium titanate (2003)

Kopycinska, M., Ziebert, C., Schmitt, H., Rabe, U., Hirsekorn, S., Arnold, W.

In this study the influence of the annealing conditions on the surface morphology and the elastic and piezoelectric properties of thin-film lead calcium titanate samples were investigated with...

High-resolution characterization of piezoelectric ceramics by ultrasonic scanning force microscopy techniques (2002)

Rabe, U., Kopycinska, M., Hirsekorn, S., Munoz Saldana, J., Schneider, G., Arnold, W.

The local elastic properties and the ferroelectric domain configuration of piezoelectric ceramics have been examined by atomic force acoustic microscopy and by ultrasonic piezoelectric force...

Imaging of the ferroelectric domains pattern in the ultrasonic piezo-mode (2002)

Kopycinska, M., Rabe, U., Hirsekorn, S., Arnold, W.

The Atomic Force Acoustic Microscope technique (AFAM) has been applied in order to investigate the elastic properties of different types of materials. With this technique it is possible to resolve...

Evaluation of the contact resonance frequencies in atomic force microscopy as a method for surface characterisation (2002)

Rabe, U., Kopycinska, M., Hirsekorn, S., Arnold, W.

The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe techniques in the nanometer range to ultrasonics. One possible method is to...

Atomic force microscopy at ultrasonic frequencies (2002)

Arnold, W., Hirsekorn, S., Kopycinska, M., Rabe, U., Reinstädtler, M., Scherer, V.

Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surface or tip is scanned, belong to the standard features of most commercial instruments. With these...

Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy (2002)

Rabe, U., Amelio, S., Kopycinska, M., Hirsekorn, S., Kempf, M., Göken, M., ...

In atomic force acoustic microscopy (AFAM) the cantilever of an atomic force microscope (AFM) is vibrated at ultrasonic frequencies while a sample surface is scanned with the sensor tip contacting...

Measurement of Youngs modulus of clay-minerals using atomic- force acoustic microscopy (2002)

Prasad, M., Kopycinska, M., Rabe, U., Arnold, W.

Measurement of young's modulus of clay minerals using atomic force acoustic microscopy (2002)

Prasad, M., Kopycinska, M., Rabe, U., Arnold, W.

Abbildung und Messung lokaler mechanischer Materialparameter mittels Ultraschall-Kraftmikroskopie (2001)

Rabe, U., Kopycinska, M., Hirsekorn, S., Arnold, W.

Atomic Force Microscopy at Ultrasonic Frequencies (2001)

Arnold, W., Hirsekorn, S., Kopycinska, M., Rabe, U.

In Atomic Force Microscopy (AFM) deflection of a microfabricated elastic beam with a sensor tip at its end is used to generate high-resolution images of surfaces. Dynamic modes, where the cantilever...

Untersuchung der Mikrostruktur von Werkstoffen mittels dynamischer Rasterkraftmikroskopie im Ultraschallbereich (2000)

Arnold, W., Amelio, S., Hirsekorn, S., Kopycinska, M., Rabe, U.

In Atomic Force Microscopy (AFM) deflection of a micro-fabricated elastic beam with a sensor tip at ist end is used to generate high-resolution images of surfaces. Dynamic modes, where the cantilever...