M. Pajek

Publication List Details

Period

2005 - 2009

Number

21

Co-Authors

Observation of ultralow-level Al impurities on a silicon surface by high-resolution grazing emission x-ray fluorescence excited by synchrotron radiation (2009)

Kubala-Kukus, A., Banas, D., Cao, Wei, Dousse, Jean-Claude, Hoszowska, Joanna, Kayser, Yves, ...

We demonstrate that ultralow-level Al impurities on a silicon surface can be measured by using the high-resolution grazing emission x-ray fluorescence (GEXRF) technique combined with...

Observation of ultralow-level Al impurities on a silicon surface by high-resolution grazing emission x-ray fluorescence excited by synchrotron radiation (2009)

Kubala-Kukus, A., Banas, D., Cao, Wei, Dousse, Jean-Claude, Hoszowska, Joanna, Kayser, Yves, ...

We demonstrate that ultralow-level Al impurities on a silicon surface can be measured by using the high-resolution grazing emission x-ray fluorescence (GEXRF) technique combined with...

Crystal optics for hard-X-ray spectroscopy of highly charged ions (2009)

Beyer, H.F., Attia, D., Banas, D., Bigot, E.-O. Le, Bosch, F., Dousse, Jean-Claude, ...

A twin crystal-spectrometer assembly, operated in the focusing compensated asymmetric Laue geometry has been developed for accurate spectroscopy of fast highly charged heavy ions in the hard-X-ray...

Crystal optics for hard-X-ray spectroscopy of highly charged ions (2009)

Beyer, H.F., Attia, D., Banas, D., Bigot, E.-O. Le, Bosch, F., Dousse, Jean-Claude, ...

A twin crystal-spectrometer assembly, operated in the focusing compensated asymmetric Laue geometry has been developed for accurate spectroscopy of fast highly charged heavy ions in the hard-X-ray...

Application of the high-resolution grazing-emission x-ray fluorescence method for impurities control in semiconductor nanotechnology (2009)

Szlachetko, Jakub, Banaś, D., Kubala-Kukuś, A., Pajek, M., Cao, Wei, Dousse, Jean-Claude, ...

We report on the application of synchrotron radiation based high-resolution grazing-emission x-ray fluorescence (GEXRF) method to measure low-level impurities on silicon wafers. The presented...

Application of the high-resolution grazing-emission x-ray fluorescence method for impurities control in semiconductor nanotechnology (2009)

Szlachetko, Jakub, Banaś, D., Kubala-Kukuś, A., Pajek, M., Cao, Wei, Dousse, Jean-Claude, ...

We report on the application of synchrotron radiation based high-resolution grazing-emission x-ray fluorescence (GEXRF) method to measure low-level impurities on silicon wafers. The presented...

The enhancement effect in K-shell radiative recombination of U⁹²⁺ ions with cooling electrons (2009)

Banaś, D., Pajek, M., Stöhlker, Th., Beyer, H. F., Böhm, S., Bosch, F., ...

We report the results of the x-ray radiative recombination (RR) experiment at the electron cooler of the ESR storage ring performed, for the first time, for detuned (off-cooling) electron energies....

The enhancement effect in K-shell radiative recombination of U⁹²⁺ ions with cooling electrons (2009)

Banaś, D., Pajek, M., Stöhlker, Th., Beyer, H. F., Böhm, S., Bosch, F., ...

We report the results of the x-ray radiative recombination (RR) experiment at the electron cooler of the ESR storage ring performed, for the first time, for detuned (off-cooling) electron energies....

Vacancy rearrangement processes in multiply ionized atoms (2007)

Czarnota, M., Pajek, M., Banas, D., Dousse, Jean-Claude, Maillard, Yves-Patrick, Mauron, Olivier, ...

We demonstrate that in order to interpret the x-ray satellite structure of Pd Lα1,2(L₃M4,5) transitions excited by fast O ions, which was measured using a high-resolution von Hamos crystal...

Vacancy rearrangement processes in multiply ionized atoms (2007)

Czarnota, M., Pajek, M., Banas, D., Dousse, Jean-Claude, Maillard, Yves-Patrick, Mauron, Olivier, ...

We demonstrate that in order to interpret the x-ray satellite structure of Pd Lα1,2(L₃M4,5) transitions excited by fast O ions, which was measured using a high-resolution von Hamos crystal...

High-resolution study of the x-ray resonant Raman scattering process around the 1s absorption edge for aluminium, silicon, and their oxides (2007)

Szlachetko, Jakub, Dousse, Jean-Claude, Berset, Michel, Fennane, Karima, Szlachetko, Monika, Hoszowska, Joanna, ...

X-ray resonant Raman scattering (RRS) spectra of Al, Al₂O₃, Si, and SiO₂ were measured at the European Synchrotron Radiation Facility, using a high-resolution Bragg-type curved crystal...

High-resolution study of the x-ray resonant Raman scattering process around the 1s absorption edge for aluminium, silicon, and their oxides (2007)

Szlachetko, Jakub, Dousse, Jean-Claude, Berset, Michel, Fennane, Karima, Szlachetko, Monika, Hoszowska, Joanna, ...

X-ray resonant Raman scattering (RRS) spectra of Al, Al₂O₃, Si, and SiO₂ were measured at the European Synchrotron Radiation Facility, using a high-resolution Bragg-type curved crystal...

High-resolution study of x-ray resonant Raman scattering at the k edge of silicon (2007)

Szlachetko, Jakub, Dousse, Jean-Claude, Hoszowska, J., Pajek, M., Barrett, R., Berset, Michel, ...

We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed...

High-resolution study of x-ray resonant Raman scattering at the k edge of silicon (2007)

Szlachetko, Jakub, Dousse, Jean-Claude, Hoszowska, J., Pajek, M., Barrett, R., Berset, Michel, ...

We report on the first high-resolution measurements of the K x-ray resonant Raman scattering (RRS) in Si. The measured x-ray RRS spectra, interpreted using the Kramers-Heisenberg approach, revealed...

Multiple ionization effects in x-ray emission induced by heavy ions (2006)

Czarnota,M., Pajek,M., Banas,D., Dousse,J.-Cl., Mauron,O., ...

The x-ray satellite structure of Pd Lalpha1,2(L3M4,5) transition excited by an impact of O7+ and Ne6+ ions with energies 279 and 178 MeV, respectively, which were measured using a high-resolution von...

Resonant X-ray Raman scattering for Al, Si and their oxides (2006)

Szlachetko, Jakub, Berset, Michel, Dousse, Jean-Claude, Fennane, Karima, Szlachetko, Monika, Barrett, R., ...

High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using...

Resonant X-ray Raman scattering for Al, Si and their oxides (2006)

Szlachetko, Jakub, Berset, Michel, Dousse, Jean-Claude, Fennane, Karima, Szlachetko, Monika, Barrett, R., ...

High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using...

Natural widths of hypersatellite K-X-ray lines and lifetimes of double K-hole states in mid-Z atoms (2005)

Rzadkiewicz, J., Chmielewska, D., Sujkowski, Z., Berset, Michel, Dousse, Jean-Claude, Maillard, Yves-Patrick, ...

K-X-ray spectra of Zr, Nb, Mo and Pd targets bombarded with 250 MeV carbon and 360 MeV oxygen ions are studied with high resolution diffraction spectrometry. Relative yields and natural widths of the...

Natural widths of hypersatellite K-X-ray lines and lifetimes of double K-hole states in mid-Z atoms (2005)

Rzadkiewicz, J., Chmielewska, D., Sujkowski, Z., Berset, Michel, Dousse, Jean-Claude, Maillard, Yves-Patrick, ...

K-X-ray spectra of Zr, Nb, Mo and Pd targets bombarded with 250 MeV carbon and 360 MeV oxygen ions are studied with high resolution diffraction spectrometry. Relative yields and natural widths of the...