Martin Mller

Double layer coating for high resolution low temperature SEM This article is published in The Journal of Microscopy (1995),Vol. 179, pp 229-237. (2007)

Paul Walther, Ernst Wehrli, Ren Hermann, Martin Mller

etching SUMMARY Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary...

Double layer coating for high resolution low temperature SEM This article is published in The Journal of Microscopy (1995),Vol. 179, pp 229-237. (2007)

Paul Walther, Ernst Wehrli, Ren Hermann, Martin Mller

etching SUMMARY Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary...

Double layer coating for high resolution low temperature SEM This article is published in The Journal of Microscopy (1995),Vol. 179, pp 229-237. (2007)

Paul Walther, Ernst Wehrli, Ren Hermann, Martin Mller

etching SUMMARY Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary...

1 (2007)

Martin Mller, Joachim Niehren, Ralf Treinen

The system FT of ordering constraints over feature trees has been introduced as an extension of the system FT of equality constraints over feature trees. We investigate the first-order theory of FT...