Detailed arsenic concentration profiles at Si/SiO2 interfaces (2008)
Pei, L., Duscher, G., Steen, C., Pichler, P., Ryssel, H., Napolitani, E., ...
The pile-up of arsenic at the Si/SiO2 interface after As implantation and annealing was investigated by high resolution Z-contrast imaging, electron energy-loss spectroscopy (EELS), grazing incidence...
Detailed arsenic concentration profiles at Si/SiO2 interfaces (2008)
Pei, L., Duscher, G., Steen, C., Pichler, P., Ryssel, H., Napolitani, E., ...
The pile-up of arsenic at the Si/SiO2 interface after As implantation and annealing was investigated by high resolution Z-contrast imaging, electron energy-loss spectroscopy (EELS), grazing incidence...
Dispersion characteristics of grooved microstrip line (GMSL) (2000)
Chamma, W, Gupta, N, Shafai, L
In this paper, the method of lines and finite-difference time-domain numerical methods are used to investigate the field distribution, dispersion, and impedance characteristics of the grooved...