Microstructural Study of Ti-Rich Alloys Formed by Ion Beam Mixing of the Fe-Ti System. (1998)
Brenier, R., Thevenard, P., Capra, T., Perez, A., Treilleux, M.
An ion beam mixing study of the Fe-Ti system has been performed at 320 K; by transmission electron microscopy within the range 0< or =x< or =45, the Fe(sub x)Ti(sub (100-x)) phases formed as a...
Structure, Mechanical, and Tribological Properties of Titanium Implanted Alumina. (1998)
Ramos, S. M. M., Canut, B., Gea, L, Thevenard, P., Bauer, M.
A study of the effects of titanium ion implantation on the structural, mechanical, and tribological properties of single crystal and polycrystalline alpha-alumina has has been carried out. Rutherford...
Characterization of Europium Implanted LiNbO3. (1998)
Moretti, P., Canut, B., Ramos, S. M. M., Brenier, R., Thevenard, P.
LiNbO3 single crystals were implanted at room temperature with Eu(+) ions at 70 keV with fluence ranging from 0.5 to 5 x10(16) ions/cm sq. The damage in the implanted layer has been investigated by...
Nanotips produced by energetic ionss or cluster impacts_. Application for flat pannel display (1998)
Thevenard, P., Valentin, O., Dupin, J.P., Purcell, S.T., Thevenard (p) ; Valentin (o) ; Dupin (j P) ; Purcell (s T) ; Vu Thien Binh ; Cadete Santos Aires (f J) ; Mazerand (p),, Cadete Santos Aires, F.J., ...
Beranger, M., Thevenard, P., Brenier, R., Canut, B., Ramos, S. M. M., Brunelle, A., ...
Single crystals of magnesium oxide containing nanoprecipitates of sodium were bombarded with swift ions (∼GeV-Pb, U) or cluster beams (∼20 MeV-C60) to study the phase change induced by electronic...
Swift-uranium-ion-induced damage in sapphire (1995)
Canut, B., Benyagoub, A., Marest, G., Meftah, A., Moncoffre, N., Ramos, S.M.M., ...
Swift-uranium-ion-induced damage in sapphire (1995)
Canut, B., Benyagoub, A., Marest, G., Meftah, A., Moncoffre, N., Ramos, S.M.M., ...
Chemical effects in ion beam mixing of Fe-Al multilayers (1994)
Brenier, R., Canut, B., Gea, L., Ramos, S., Thevenard, P., Dubois, C., ...
Fe-Al multilayers have been mixed with Xe+ ions at high temperatures. The composition depth profiles have been analyzed by secondary ion mass spectroscopy (SIMS). It is shown that SIMS reveals the...
Chemical effects in ion beam mixing of Fe-Al multilayers (1994)
Brenier, R., Canut, B., Gea, L., Ramos, S., Thevenard, P., Dubois, C., ...
Fe-Al multilayers have been mixed with Xe+ ions at high temperatures. The composition depth profiles have been analyzed by secondary ion mass spectroscopy (SIMS). It is shown that SIMS reveals the...
Chemical effects in ion beam mixing of Fe-Al multilayers (1994)
Brenier, R., Canut, B., Gea, L., Ramos, S., Thevenard, P., Dubois, C., ...
Fe-Al multilayers have been mixed with Xe+ ions at high temperatures. The composition depth profiles have been analyzed by secondary ion mass spectroscopy (SIMS). It is shown that SIMS reveals the...
High energy heavy ion irradiation effects in alpha a $\ell_2o_3$ (1993)
Canut, B., Ramos, S.M.M., Thevenard, P., Moncoffre, N., Benyagoub, A., Marest, G., ...
High energy heavy ion irradiation effects in alpha a $\ell_2o_3$ (1993)
Canut, B., Ramos, S.M.M., Thevenard, P., Moncoffre, N., Benyagoub, A., Marest, G., ...
Hydrogenated carbon layers produced by ion beam irradiation of pmma and polystyrene films (1990)
Davenas, J., Thevenard, P., Boiteux, G., Fallavier, M., Lu, X.L.
Hydrogenated carbon layers produced by ion beam irradiation of pmma and polystyrene films (1990)
Davenas, J., Thevenard, P., Boiteux, G., Fallavier, M., Lu, X.L.
Atomic mixing in insulating crystals containing small metallic aggregates (1984)
Thevenard, P., Treilleux, M., Rualt, M.O., Chaumont, J., Bernas, H.
Atomic mixing in insulating crystals containing small metallic aggregates (1984)
Thevenard, P., Treilleux, M., Rualt, M.O., Chaumont, J., Bernas, H.
EXTENDED DEFECTS AND PRECIPITATES IN IMPLANTED TiO2 (1981)
TiO2 single crystals implanted at 77 K with heavy ions in the energy range (100 keV-500keV) have been observed using transmission electron microscopy (T.E.M.) and X ray diffraction at glancing...
EXTENDED DEFECTS AND PRECIPITATES IN IMPLANTED TiO2 (1981)
TiO2 single crystals implanted at 77 K with heavy ions in the energy range (100 keV-500keV) have been observed using transmission electron microscopy (T.E.M.) and X ray diffraction at glancing...
EXTENDED DEFECTS AND PRECIPITATES IN IMPLANTED TiO2 (1981)
TiO2 single crystals implanted at 77 K with heavy ions in the energy range (100 keV-500keV) have been observed using transmission electron microscopy (T.E.M.) and X ray diffraction at glancing...
COLLOID ABSORPTION BANDS ASSOCIATED WITH IMPLANTED ALKALI IONS IN MgO SINGLE CRYSTALS (1976)
Defects induced in MgO with implanted alkali ions in the 0.5 MeV range have been investigated by optical absorption measurements. Vacancies defect (F+ or F) and V centers are observed after...
Perez, A., Davenas, J., Thevenard, P., Dupuy, C.H.S., Morin, P., Vicario, E.
Un microscope électronique à balayage équipé d'un système de décharge pour l'observation des échantillons isolants nous a permis d'étudier des cristaux de LiF bombardés avec des protons de 2...
COLLOID ABSORPTION BANDS ASSOCIATED WITH IMPLANTED ALKALI IONS IN MgO SINGLE CRYSTALS (1976)
Defects induced in MgO with implanted alkali ions in the 0.5 MeV range have been investigated by optical absorption measurements. Vacancies defect (F+ or F) and V centers are observed after...
Perez, A., Davenas, J., Thevenard, P., Dupuy, C.H.S., Morin, P., Vicario, E.
Un microscope électronique à balayage équipé d'un système de décharge pour l'observation des échantillons isolants nous a permis d'étudier des cristaux de LiF bombardés avec des protons de 2...
COLLOID ABSORPTION BANDS ASSOCIATED WITH IMPLANTED ALKALI IONS IN MgO SINGLE CRYSTALS (1976)
Defects induced in MgO with implanted alkali ions in the 0.5 MeV range have been investigated by optical absorption measurements. Vacancies defect (F+ or F) and V centers are observed after...
Perez, A., Davenas, J., Thevenard, P., Dupuy, C.H.S., Morin, P., Vicario, E.
Un microscope électronique à balayage équipé d'un système de décharge pour l'observation des échantillons isolants nous a permis d'étudier des cristaux de LiF bombardés avec des protons de 2...