Luminescence imaging for the detection of shunts on silicon solar cells (2008)
Kasemann, M., Grote, D., Walter, B., Kwapil, W., Trupke, T., Augarten, Y., ...
Spatially resolved silicon solar cell characterization using infrared imaging methods (2008)
Kasemann, M., Kwapil, M., Schubert, M., Habenicht, H., Walter, B., The, M., ...
We present a comprehensive overview over infrared imaging techniques for (electrical) silicon solar cell characterization. Recent method development in local series resistance imaging is reviewed in...
Photoluminescence lifetime spectroscopy - Surface recombination analysis (2007)
Roth, T., Rüdiger, M., Rosenits, P., Diez, S., Trupke, T., Bardos, R.A., ...
Fast series resistance imaging using photoluminescence (2007)
Pink, E., Trupke, T., Bardos, R.A., Abbott, M.D., Augarten, Y., Kontermann, S.
Shunt detection capabilities of luminescence imaging on silicon solar cells (2007)
Kasemann, M., Grote, D., Walter, B., Trupke, T., Augarten, Y., Bardos, R.A., ...
Progress with luminescence imaging for the characterisation of silicon wafers and solar cells (2007)
Trupke, T., Bardos, R.A., Abbott, M.D., Pink, E., Augarten, Y., Chen, F.W., ...
Photoluminescence imaging of silicon wafers (2006)
Trupke, T., Bardos, R.A., Schubert, M.C., Warta, W.
Photoluminescence imaging is demonstrated to be an extremely fast spatially resolved characterization technique for large silicon wafers. The spatial variation of the effective minority carrier...
Bardos, R.A., Trupke, T., Schubert, M.C., Roth, T.
Photoluminescence and photoconductance lifetime measurements on multicrystalline silicon wafers are presented. It is demonstrated experimentally that the large overestimation of the lifetime at low...
Recent results of radiation damage studies in silicon (1994)
Bates, S, Gorfine, G W, Munday, D J, Parker, M A, Anghinolfi, Francis, Chilingarov, A G, ...
Electronics and readout of a large area silicon detector for LHC (1994)
Bonino, R, Borer, K, Munday, D J, Parker, M A, Anghinolfi, F, Aspell, P, ...