Atomic Scale Memory at a Silicon Surface (2002)
Bennewitz, R., Crain, J. N., Kirakosian, A., Lin, J. -L., McChesney, J. L., Petrovykh, D. Y., ...
The limits of pushing storage density to the atomic scale are explored with a memory that stores a bit by the presence or absence of one silicon atom. These atoms are positioned at lattice sites...
Probing electron induced defects in CaF2 by photothermal displacement (1994)
Reichling, M., Bennewitz, R., Matthias, E.
The surface displacement technique is used to measure the temperature and frequency dependence of the periodic expansion of a CaF2-surface subject to a modulated focused beam of 1keV electrons....
Probing electron induced defects in CaF2 by photothermal displacement (1994)
Reichling, M., Bennewitz, R., Matthias, E.
The surface displacement technique is used to measure the temperature and frequency dependence of the periodic expansion of a CaF2-surface subject to a modulated focused beam of 1keV electrons....
Probing electron induced defects in CaF2 by photothermal displacement (1994)
Reichling, M., Bennewitz, R., Matthias, E.
The surface displacement technique is used to measure the temperature and frequency dependence of the periodic expansion of a CaF2-surface subject to a modulated focused beam of 1keV electrons....