Ren Hermann

Double layer coating for high resolution low temperature SEM This article is published in The Journal of Microscopy (1995),Vol. 179, pp 229-237. (2007)

Paul Walther, Ernst Wehrli, Ren Hermann, Martin Mller

etching SUMMARY Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary...

Double layer coating for high resolution low temperature SEM This article is published in The Journal of Microscopy (1995),Vol. 179, pp 229-237. (2007)

Paul Walther, Ernst Wehrli, Ren Hermann, Martin Mller

etching SUMMARY Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary...

Double layer coating for high resolution low temperature SEM This article is published in The Journal of Microscopy (1995),Vol. 179, pp 229-237. (2007)

Paul Walther, Ernst Wehrli, Ren Hermann, Martin Mller

etching SUMMARY Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary...