Nayak, Maheswar, Lodha, GS, Sinha, AK, Nandedkar, RV, Shivashankar, SA
The authors report determination of interlayer composition with subnanometer sensitivity at the buried interfaces using soft x-ray resonant reflectivity technique. Near the absorption edge, fine...
Nayak, Maheswar, Lodha, GS, Sinha, AK, Nandedkar, RV, Shivashankar, SA
The authors report determination of interlayer composition with subnanometer sensitivity at the buried interfaces using soft x-ray resonant reflectivity technique. Near the absorption edge, fine...