PRINCIPLES AND APPLICATIONS OF DEFOCUS-IMAGE MODULATION PROCESSING ELECTRON MICROSCOPY (2008)
Yoshizo Takai, Toshiyuki Ando, Takashi Ikuta, Ryuichi Shimizu, Yoshizo Takai
Principles of defocus-image modulation processing (DIMP) are described from a view point of three-dimensional image formation in transmission electron microscopy (TEM). Two types of defocus-image...
Dynamic Observation of an Atom-Sized Gold Wire by Phase Electron Microscopy (2001)
Ikuta, Takashi, Kawasaki, Tadahiro, Kimura, Yoshihide, Shimizu, Ryuichi, Takai, Yoshizo
Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum (2001)
Kawasaki, Tadahiro, Takai, Yoshizo, Ikuta, Takashi, Shimizu, Ryuichi
A method to obtain a nano‐area electron diffraction pattern in transmission electron microscopy (TEM) was proposed, based on three‐dimensional (3D) image formation theory. This method...
Fourier analysis of HRTEM image deterioration caused by mechanical vibration (2001)
Kawasaki, Tadahiro, Kimura, Yoshihide, Takai, Yoshizo, Shimizu, Ryuichi
Contrast deterioration of high‐resolution transmission electron microscope (HRTEM) images, that is caused by mechanical vibrations of the turbo molecular pump (TMP), was systematically and...
Nanoprobe cathodoluminescence scanning electron microscope as applied to synthesized diamond (1999)
Matsuo, Hiroshi, Awata, Shogo, Kimura, Yoshihide, Shimizu, Ryuichi
A specific cold stage and programmable photon counting system was developed for the nanoprobe cathodoluminescence scanning electron microscope (CLSEM) to characterize synthesized diamonds. This...
Kimura, Yoshihide, Takai, Yoshizo, Kawasaki, Tasahiro, Shimizu, Ryuichi, Ikuta, Takashi, Isakozawa, Shigeto, ...
A real-time ‘defocus image modulation processing electron microscope’ (DIMP-EM) has been developed by the ‘Research for the Future Program’ which was started in 1996 by the Japan Society for...
Takai, Yoshizo, Kimura, Yoshihide, Ikuta, Takashi, Shimizu, Ryuichi, Sato, Yuji, Isakozawa, Shigehito, ...
A real-time defocus-image modulation processing lectron microscope, which utilizes a custom designed, floating type, accelerating voltage generation system to modulate focus quickly and precisely,...
Optimization of voltage axis alignment in high-resolution electron microscopy (1999)
Utsuro, Hidetoshi, Takai, Yoshizo, Ikuta, Takashi, Shimizu, Ryuichi
An improved method for optimizing the voltage axis alignment is proposed. This method is based on averaging of the through-focus images by vibrating the accelerating-voltage rapidly, referred to as...
Evaluation of image drift correction by three-dimensional Fourier analysis (1999)
Kawasaki, Tadahiro, Utsuro, Hidetoshi, Takai, Yoshizo, Shimizu, Ryuichi
The cross-correlation function has been applied to correct linear and random image drifts included in a through-focus series of images. A novel method based on three-dimensional Fourier analysis is...
Yoshizo Takai, Hidetoshi Utsuro, Yoshihide Kimnra, Takashi Ikuta, Ryuichi Shimizu
Preliminary experiments for development of real-time defocus-image modulation processing electron microscope
Surface characterization of th Zr-O/W(100) system, widely used as a high stability and high brightness cathode, was performed under operating conditions of ({small tilde}1710 K and {small...
Takai, Yoshizo, Utsuro, Hidetoshi, Kimura, Yoshihide, Ikuta, Takashi, Shimizu, Ryuichi
Preliminary experimental results for realizing real-time defocus-image modulation processing in a high-resolution transmission electron microscope are reported in terms of equivalence between...
Observation of Al surface during sputter-cleaning and annealing procedures under UHV-REM (1998)
Akita, Tomoki, Nagata, Takanori, Kimura, Yoshihide, Takai, Yoshizo, Shimizu, Ryuichi
Clean surfaces of aluminum obtained by repeated sputter-cleaning and annealing were observed using UHV-reflection electron microscopy (REM) equipped with an infrared heating apparatus and an in situ...
Yasuno, Motohide, Kimura, Yoshihide, Shimizu, Ryuichi
A coincidence electron microscopic image was successfully observed by using signal electrons that generated characteristic X-rays (Ag L X-rays) during penetration through a specimen (a silver film)....
Development of a Nanoprobe Cathodoluminescence Scanning Electron Microscope (1996)
Matsuo, Hiroshi, Kobayashi, Nobutaka, Kimura, Yoshihide, Shimizu, Ryuichi
A nanoprobe cathodoluminescence (CL) scanning electron microscope was developed, in which a specific optical system consisting of an ellipsoidal mirror, optical light guide, spectrometer and specimen...
Kimura, Yoshihide, Yasuno, Motohide, Shimizu, Ryuichi
An image-construction system for a coincidence transmission electron microscope (coincidence TEM) was developed. The coincidence TEM based on a coincidence measurement technique allows us to select...
Ando, Toshiyuki, Taniguchi, Yoshifumi, Takai, Yoshizo, Kimura, Yoshihide, Shimizu, Ryuichi, Ikuta, Takashi
Real-time phase-plateless electron phase microscopy based on active image processing has been developed by utilizing accelerating-voltage modulation. This new method is based on the real-time...
A New Specimen Holder for UHV-Reflection Electron Microscopy (1994)
Akita, Tomoki, Matsuo, Hiroshi, Kimura, Yoshihide, Shimizu, Ryuichi
A newly designed double-tilting specimen-bolder was constructed for a UHV-reflection electron microscopy (REM). The specimen holder ensures the open space in front of the specimen surface, which...
Determination of Partially Coherent Parameters by Lattice Image Contrast in TEM (1993)
Takai, Yoshizo, Taniguchi, Yoshifumi, Shimizu, Ryuichi
A new method is proposed to measure a beam divergence angle and chromatic defocus spread in a transmission electron microscope. In the proposed method, these two parameters are determined by the...
Study of Defects and Strains on Cleaved GaAs (110) Surface by Reflection Electron Microscopy (1992)
Takeguchi, Masaki, Harada, Ken, Shimizu, Ryuichi
Interactions between strain field of screw dislocation and surface defects (surface step and localized distortion) on cleaved GaAs (110) surface were studied by reflection electron microscopy (REM)....
A New FFT Method for Numerical Reconstruction in Electron Holography (1991)
A new numerical reconstruction method for electron holography is proposed. This method based on the FFT subfringe interferometry needs two images, coherent intensity distribution (hologram) which has...
Aberration Correction by Electron Holography Using Numerical Reconstruction Method (1990)
Harada, Ken, Ogai, Keiko, Shimizu, Ryuichi
Electron holography has been performed to correct the aberrations of an objective lens in electron microscope. The aberrations, particularly defocusing aberration, are corrected at the stage of...
The Fringe Scanning Method as Numerical Reconstruction for Electron Holography (1990)
Harada, Ken, Ogai, Keiko, Shimizu, Ryuichi
A novel numerical reconstruction method for electron holography is proposed. This method based on both the fringe scanning technique and the Moire topography has the advantages of being independent...
Taniguchi, Yoshifumi, Ikuta, Takashi, Endoh, Hisamitsu, Shimizu, Ryuichi
The defocus-modulation-type active image processing (DMAIP) system for high resolution electron microscopy has been developed. The image shift associated with the change of the defocus value, which...
Observation of GaAs(110) Surface Defect by Reflection Electron Holography (1990)
Takeguchi, Masaki, Harada, Ken, Shimizu, Ryuichi
Reflection electron holography was successfully performed for observation of GaAs(110) surface defect. The phase distribution of object and/or conjugate wave reflected from the surface was...