Amelio, S., Redjaimiia, A., Lach, E., Lichtenberger, A.
The mechanical behaviour of a gamma-TiAl alloy and its microstructural evolution are investigated in this work. The alloy has a nominal composition of Ti-46.5A]-4(Cr, Nb, Ta, B) (at. %) and presents...
Rabe, U., Amelio, S., Kopycinska, M., Hirsekorn, S., Kempf, M., Göken, M., ...
In atomic force acoustic microscopy (AFAM) the cantilever of an atomic force microscope (AFM) is vibrated at ultrasonic frequencies while a sample surface is scanned with the sensor tip contacting...
Amelio, S., Goldade, A., Rabe, U., Scherer, V., Bhushan, B., Arnold, W.
We present a comparative study of the elastic stiffness of ultra-thin (5,20 and 100 nm thick) diamond-like carbon coatings with a sampling depth less than or comparable to the thickness of the...
Hochauflösende Abbildung von Oberflächensteifigkeiten mittels Ultraschall-Kraftmikroskopie (2001)
Rabe, U., Amelio, S., Hirsekorn, S., Arnold, W.
Unter Ultraschall-Kraftmikroskopie (AFAM für "Atomic Force Acoustic Microscopy") versteht man Techniken, bei denen Ultraschallwellen in der Probe und in der mikroskopischen Blattfeder des...
Hochauflösende Abbildung von Oberflächensteifigkeiten mittels Ultraschall-Kraftmikroskopie (2001)
Rabe, U., Amelio, S., Hirsekorn, S., Arnold, W.
Unter Ultraschall-Kraftmikroskopie (AFAM für "Atomic Force Acoustic Microscopy") versteht man Techniken, bei denen Ultraschallwellen in der Probe und in der mikroskopischen Blattfeder des...
Imaging of ferroelectric domains by atomic force aoustic microscopy (2000)
Rabe, U., Amelio, S., Hirsekorn, S., Arnold, W.
Atomic Force Microscopy (AFM) is a near-field technique to generate high-resolution images of surfaces. A microfabricated elastic beam with an integrated sharp sensor tip at its end is scanned over...
Quantitative contact spectroscopy by atomic force acoustic microscopy (2000)
Amelio, S., Rabe, U., Kester, E., Hirsekorn, S., Arnold, W.
The evaluation of the cantilever vibration spectra at ultrasonic frequencies in an AFM is presented in order to descern local elastic data quantitatively. In imaging, our technique allows e. g. to...
Arnold, W., Amelio, S., Hirsekorn, S., Kopycinska, M., Rabe, U.
In Atomic Force Microscopy (AFM) deflection of a micro-fabricated elastic beam with a sensor tip at ist end is used to generate high-resolution images of surfaces. Dynamic modes, where the cantilever...
Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy (2000)
Arnold, W., Amelio, S., Hirsekorn, S., Rabe, U.
Atomic Force Acoustic Microscopy is a near-field technique which combines the ability in using ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes....
Quantitative Determination of Contact Stiffness Using Atomic Force Acoustic Microscopy (2000)
Rabe, U., Amelio, S., Kester, E., Scherer, V., Hirsekorn, S., Arnold, W.
Atomic force acoustic microscopy is a near-field technique which combines the ability of ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We...