ABSTRACT AnSER: A Lightweight Reliability Evaluator for use in Logic Synthesis (2008)
Smita Krishnaswamy, Stephen M. Plaza, Igor L. Markov, John P. Hayes
As device features continue to scale, traditional circuit optimizations targeting area and delay have to be closely monitored for their effect on reliability. Yet, existing reliability analysis...
Abstract Logic Circuit Testing for Transient Faults (2008)
Smita Krishnaswamy, Igor L. Markov, John P. Hayes
Transient faults are becoming an increasingly serious concern for logic circuits. They can be caused by thermal neutrons, present at all altitudes, and by other types of ionizing radiation,...
Enhancing Design Robustness with Reliability-aware Resynthesis and Logic Simulation ABSTRACT (2008)
Smita Krishnaswamy, Stephen M. Plaza, Igor L. Markov, John P. Hayes
While the density of integrated circuits tends to double with each new process technology generation, reliability tends to decrease. Known ways of improving reliability result in high area overhead,...
Computer-Aided Design for Emerging Technologies (2008)
Smita Krishnaswamy, Igor L. Markov, John P. Hayes
The diverse nature of the faults and defects that may occur at nanoscale ranges necessitates new techniques for ATPG. This article proposes an efficient technique that relies on a probabilistic...
Abstract Enhancing Design Robustness with Reliability-aware Resynthesis and Logic Simulation (2008)
Smita Krishnaswamy, Stephen M. Plaza, Igor L. Markov, John P. Hayes
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this problem such as TMR...
George F. Viamontes, Professor John, P. Hayes, Steve Plaza, Smita Krishnaswamy, Jin Hu, ...
To my family and friends ii ACKNOWLEDGEMENTS I would like to thank many people who were instrumental in helping me finish my Ph.D. My advisors John Hayes and Igor Markov provided me with excellent...
Functional Design Error Diagnosis, Correction and Layout Repair of Digital Circuits (2007)
Kai-hui Chang, Smita Krishnaswamy, Hector Garcia, Aaron Ng, James Lu, Jeff Hao, ...
ii ACKNOWLEDGEMENTS I would like to thank my advisers Professor Igor Markov and Professor Valeria Bertacco. They offered valuable guidance and taught me how to conduct solid research. In addition,...
Functional Design Error Diagnosis, Correction and Layout Repair of Digital Circuits (2007)
Kai-hui Chang, Smita Krishnaswamy, Hector Garcia, Aaron Ng, James Lu, Jeff Hao, ...
ii ACKNOWLEDGEMENTS I would like to thank my advisers Professor Igor Markov and Professor Valeria Bertacco. They offered valuable guidance and taught me how to conduct solid research. In addition,...
When are multiple gate errors significant in logic circuits (2006)
Smita Krishnaswamy, Igor L. Markov, John P. Hayes
Most recent works on soft errors only address circuit reliability under single gate errors caused by SEUs. In this paper, we compare the probabilities of single and multiple errors. We formulate a...
Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices (2005)
Krishnaswamy, Smita, Viamontes, George F., Markov, Igor L., Hayes, John P.
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on probabilistic...
Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices (2005)
Krishnaswamy, Smita, Viamontes, George F., Markov, Igor L., Hayes, John P.
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on probabilistic...
Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices (2005)
Smita Krishnaswamy, George F. Viamontes, Igor L. Markov, John P. Hayes
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on probabilistic...
Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices (2005)
Smita Krishnaswamy, George F. Viamontes, Igor L. Markov, John P. Hayes
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on probabilistic...
Design, Analysis and Test of Logic Circuits under Uncertainty.
Integrated circuits are increasingly susceptible to uncertainty caused by soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects...