Soft X-Ray Investigation of Mg and Al Oxides: Evidence for Atomic and Bandlike Features. (9999)
O'Brien, W. L., Jia, J., Dong, Q. Y., Callcott, T. A., Mueller, D. R.
Nakamura, J., Nasubida, S., Kabasawa, E., Yamazaki, H., Yamada, N., Kuroki, K., ...
The effect of electron correlation (EC) on the electronic structure in MgB$_2$, AlB$_2$ and ZrB$_2$, is studied by examining the partial density of states (PDOS) of B-2$p\sigma$ and $p\pi$ orbitals...
Zhang, G. P., Chang, G. S., Callcott, T. A., Ederer, D. L., Kang, W. N., Choi, Eun-Mi, ...
Angle-resolved soft x-ray measurements made at the boron K-edge in single crystal MgB2 provide new insights into the B-2p local partial density of both unoccupied and occupied band states. The strong...
Orbital-resolved Soft X-Ray Spectroscopy in NaV2O5 (2002)
Zhang, G. P., Woods, G. T., Shirley, Eric L., Callcott, T. A., Lin, L., Chang, G. S., ...
We demonstrate that angle-resolved soft x-ray spectroscopy can resolve absorption by inequivalent oxygen sites and by different orbitals belonging to the same site in NaV2O5. By rotating the...
Electron Correlation Effects in Resonant Inelastic X-ray Scattering of NaV2O5 (2002)
Zhang, G. P., Callcott, T. A., Woods, G. T., Lin, L., Sales, Brian, Mandrus, D., ...
Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in {$\rm NaV_2O_5$}. In contrast to single photon...
Soft x-ray spectroscopy experiments on the near K-edge of B in MB2 (M=Mg, Al, Ta, and Nb) (2001)
Nakamura, J., Yamada, N., Kuroki, K., Callcott, T. A., Ederer, D. L., Denlinger, J. D., ...
Soft X-ray absorption and emission measurements are performed for the K- edge of B in MB$_2$ (M=Mg, Al, Ta and Nb). Unique feature of MgB$_2$ with a high density of B 2$p_{xy}(\sigma)$-state below...
Callcott, T. A., Lin, L., Woods, G. T., Zhang, G. P., Thompson, J. R., Paranthaman, M., ...
Soft X-ray absorption and fluorescence measurements are reported for the K-edge of B in MgB2. The measurements confirm a high density of B pxy(sigma)-states at the Fermi edge and extending to...
Electronic structure and crystalline coherence in Fe/Si multilayers (1999)
J. A. Carlisle, S. R. Blankenship, A. Chaiken, R. P. Michel, T. Van Buuren, J. J. Jia, ...
Soft x-ray fluorescence spectroscopy has been used to examine the electronic structure of deeply buried silicide thin films that arise in Fe/Si multilayers. These systems exhibit antiferromagnetic...
Soft-X-Ray Fluorescence Studies of Solids (1999)
J. A. Carlisle, S. R. Blankenship, R. N. Smith, L. J. Terminello, J. J. Jia, T. A. Callcott, ...
Resonant inelastic x-ray scattering (RIXS) has been observed in many systems above and below their core threshold. Below threshold, inelastic-loss features are observed, which disperse linearly with...
Soft X-ray fluorescence measurements of irradiated polyimide and polycarbosilane films (1999)
Kurmaev, E.Z., Winarski, R.P., Ederer, D.L., Pivin, J.C., Shamin, S.N., Moewes, A., ...
Soft X-ray fluorescence measurements of irradiated polyimide and polycarbosilane films (1999)
Kurmaev, E.Z., Winarski, R.P., Ederer, D.L., Pivin, J.C., Shamin, S.N., Moewes, A., ...
J. A. Carlisle, A. Chaiken, R. P. Michel, L. J. Terminello, J. J. Jia, T. A. Callcott, ...
Soft x-ray fluorescence spectroscopy has been employed to obtain information about the Si-derived valence band states of Fe/Si multilayers. The valence band spectra are quite different for films with...
Carlisle, J. A., Chaiken, A., Michel, R. P., Terminello, L. J., Jia, J. J., Callcott, T. A., ...
Soft x-ray fluorescence spectroscopy has been employed to obtain information about the Si-derived valence band states of Fe/Si multilayers. The valence band spectra are quite different for films with...
Lee, Sunwoo, Mazurowski, J., O'Brien, W.L., Dong, Q.Y., Jia, J.J., Callcott, T.A., ...
Boron carbide thin films of several B/C ratios have been deposited on Si(111) using plasma-enhanced chemical vapor deposition from nido-pentaborane(9) (B5H9) and methane (CH4). X-ray diffraction...