T. H. Metzger

Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging (2009)

Favre-Nicolin, V., Mastropietro, F., Eymery, J., Camacho, D., Niquet, Y. M., Borg, B. M., ...

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered...

Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by X-ray microdiffraction. (2009)

Malachias, A., Deneke, Ch., Krause, B., Mocuta, C., Kiravittaya, S., Metzger, T.H., ...

Physical Review B, 79(2009), S.035301/1-12

Structural and magnetic properties of an InGaAs/Fe$_3$Si superlattice in cylindrical geometry (2008)

Deneke, Ch., Schumann, J., Engelhard, R., Thomas, J., Müller, C., Khatri, M. S., ...

The structure and the magnetic properties of an InGaAs/Fe3Si superlattice in a cylindrical geometry are investigated by electron microscopy techniques, x-ray diffraction and magnetometry. To form a...

Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray micro-diffraction (2008)

Malachias, A., Deneke, Ch., Krause, B., Mocuta, C., Kiravittaya, S., Metzger, T. H., ...

We depict the use of x-ray diffraction as a tool to directly probe the strain status in rolled-up semiconductor tubes. By employing continuum elasticity theory and a simple model we are able to...

X-ray pushing of a mechanical microswing (2008)

Siria, A., Rodrigues, M. S., Dhez, O., Schwartz, W., Torricelli, G., Denmat, S. Le, ...

Nanoelectromechanical Systems (NEMS) are among the best candidates to measure interactions at nanoscale [1-6], especially when resonating oscillators are used with high quality factor [7, 8]. Despite...

Crystal Truncation Planes Revealed by 3D Reconstruction of Reciprocal Space (2008)

I.A. Vartanyants, A.V. Zozulya, K. Mundboth, O.M. Yefanov, ...

Journal article

Imaging of nanoislands in coherent grazing-incidence small-angle x-ray scattering experiments (2008)

A.V. Zozulya, O.M. Yefanov, I.A. Vartanyants, K. Mundboth, C. Mocuta, ...

Journal article

Imaging of nanoislands in coherent grazing-incidence small-angle x-ray scattering experiments (2008)

A.V. Zozulya, O.M. Yefanov, I.A. Vartanyants, K. Mundboth, C. Mocuta, ...

Journal article

Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands (2008)

C. Mocuta, J. Stangl, K. Mundboth, T.H. Metzger, G. Bauer, ...

Journal article

X-ray Scattering from Self-Assembled InAs Islands (2006)

W. N. Rodrigues, A. Malachias, S. Kycia, T. H. Metzger, ...

X-ray Scattering from Self-Assembled InAs Islands

Temperature influence on the production of nanodot patterns by ion beam sputtering of Si(001) (2006)

Gago, R., Vázquez, L., Plantevin, O., Sánchez-García, J.A., Varela, M., Ballesteros, M.C., ...

The temperature influence (T=300–625 K) on the production of nanodot patterns by 1 keV Ar+ ion beam sputtering (IBS) of Si(001) is addressed. The surface morphology was studied by atomic force...

Local structure of a rolled-up single crystal: An X-ray microdiffraction study of individual semiconductor nanotubes (2006)

Krause, B., Mocuta, C., Metzger, T. H., Deneke, Ch., Schmidt, O. G.

Crystals with cylindrical symmetry, not existing in nature, are mimicked by the roll-up of single-crystalline and highly strained semiconductor bilayers. Exploiting this, the local structure of such...

Guided self-assembly of lateral InAs/GaAs quantum-dot molecules for single molecule spectroscopy (2006)

Wang, L., Rastelli, A., Kiravittaya, S., Songmuang, R., Schmidt, O. G., Krause, B., ...

Solid-phase epitaxial regrowth of a shallow amorphised Si layer studied by X-ray and medium energy ion scattering (2005)

Capello, L, Metzger, T H, Werner, M, Servidori, M, Herden, M, ...

Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mapping (2005)

Schulli, T. U., Stoffel, M., Hesse, A., Stangl, J., Lechner, R. T., Wintersberger, E., ...

Shape, strain, and ordering of lateral InAs quantum dot molecules (2005)

Krause, B., Metzger, T. H., Rastelli, A., Songmuang, R., Kiravittaya, S., Schmidt, O. G.

X-ray study of atomic ordering in self-assembled Ge islands grown on Si(001) (2005)

Malachias, A., Schülli, T. U., Medeiros-Ribeiro, G., Cancado, L. G., Stoffel, M., Schmidt, O. G., ...

X-ray methods for strain and composition analysis in self-organized semiconductor nanostructures (2005)

T.H. Metzger, T. Schülli, M. Schmidbauer

Journal article

Atomic ordering in self-assembled Ge:Si(001) islands observed by X-ray scattering (2004)

Malachias, A., Schulli, T. U., Medeiros-Ribeiro, G., Stoffel, M., Schmidt, O. G., Metzger, T. H., ...

X-ray diffuse scattering in the vicinity of a basis-forbidden (200) Bragg reflection was measured for a sample with uncapped self-assembled Ge islands epitaxially grown on Si(001). Our results...

X-ray scattering from self-assembled InAs islands (2004)

Malachias,A., Neves,B. R. A., Rodrigues,W. N., Moreira,M. V. B., Kycia,S., Metzger,T. H., ...

In this work several structural and chemical properties of self-assembled InAs islands grown on GaAs(001) are studied using surface x-ray scattering with synchrotron radiation. The technique of x-ray...

X-ray waveguides and thin macromolecular films (2003)

Salditt, T., Pfeiffer, F., Perzl, H., Vix, A., Mennicke, U., Jarre, A., ...

We report waveguide-enhanced X-ray experiments on thin macromolecular films, such as spin-coated polymer films, self-assembled polyelectrolyte layers, and lipid membranes, prepared on solid surfaces....

Strain and composition distribution in uncapped SiGe islands from x-ray diffraction (2001)

Stangl, J., Daniel, A., Holý, V., Roch, T., Bauer, G., Kegel, I., ...

Critical behaviour of V2H in a defective near-surface skin layer (2000)

Trenkler,J., Moss,S. C., Reichert,H., Paniago,R., Gebhardt,U., Carstanjen,H. D., ...

Vertical correlation of SiGe islands in SiGe/Si superlattices: X-ray diffraction versus transmission electron microscopy (2000)

Stangl, J., Roch, T., Bauer, G., Kegel, I., Metzger, T. H., Schmidt, O. G., ...

Critical behaviour of V2H in a defective near-surface skin layer (2000)

Trenkler, J., Moss, S. C., Reichert, H., Paniago, R., Gebhardt, U., Carstanjen, H. D., ...

X-ray determination of local atomic displacements around carbon-vacancies in NbC§1§-§c single crystals. (1983)

Metzger, T.H., Peisl, J., Kaufmann, R.

General Meeting of the American Physical Society, Los Angeles, Calif., March 21-25, 1983

Local Probe X-ray Diffraction from Single Nanowires 2008-12-01 - 2008-12-05

J. Stangl, B. Mandl, V. Chamard, M. Keplinger, ...

Conference presentation

X-ray diffraction from semiconductor nanostructures: beyond the ensemble average 2008-07-28 - 2008-08-01

J. Stangl, C. Mocuta, K. Mundboth, A. Diaz, ...

Conference presentation